2020 International Conference On Computer Aided Design

The Premier Conference Devoted to Technical Innovations in Electronic Design Automation

November 2-5, 2020VIRTUAL CONFERENCE

MP Associates, Inc.
MONDAY November 02, 8:00am - 8:30am | Slot 2
EVENT TYPE: REGULAR SESSION
SESSION 1B
Electromigration and Circuit Yield: Efficient Verification Techniques
Moderator:
Ing-Chao Lin - National Cheng Kung Univ.
Continuing scaling of integrated circuits has made the active devices as well as interconnections even smaller, which greatly improved circuit performance, while device parameter variation and current density of wires increased significantly. The yield of the manufactured circuit and its long-term reliability have become a major concern in designing circuits. In this session, we discuss efficient electromigration immortality check methods considering current density fluctuation and Joule heating, and a fast Monte Carlo method that uses non-Gaussian adaptive importance sampling technique for accelerating the yield analyses.

1B.1*Electromigration Checking Using a Stochastic Effective Current Model
 Speaker: Adam Issa - Univ. of Toronto, Canada
 Authors: Adam Issa - Univ. of Toronto, Canada
Valeriy Sukharev - Mentor, A Siemens Business, Fremont, CA
Farid N. Najm - Univ. of Toronto, Canada
1B.2Electromigration Immortality Check considering Joule Heating Effect for Multisegment Wires
 Speaker: Mohammadamir Kavousi - Univ. of California, Riverside, CA
 Authors: Mohammadamir Kavousi - Univ. of California, Riverside, CA
Liang Chen - Univ. of California, Riverside, CA
Sheldon X. Tan - Univ. of California, Riverside, CA
1B.3A Non-Gaussian Adaptive Importance Sampling Method for High-Dimensional and Multi-Failure-Region Yield Analysis
 Speaker: Hao Yan - Southeast Univ., Nanjing, China
 Authors: Xiao Shi - Univ. of California, Los Angeles, CA
Hao Yan - Southeast Univ., Nanjing, China
chuwen li - Southeast Univ., Nanjing, China
Jianli Chen - Fudan Univ., Shanghai, China
Longxing Shi - Southeast Univ., China
Lei He - Univ. of California, Los Angeles & Fudan Univ., CA


* Indicates Best Paper Candidate