Yoshio Mita - Univ. of Tokyo
Haitong Li - Stanford Univ.
Hai Li - Duke Univ.
Vijay Narayanan - Pennsylvania State Univ.
Tajana Simunic Rosing - Univ. of California, San Diego
Takashi Sato - Kyoto Univ.
Ibrahim Elfadel - Masdar Inst. of Sci. and Tech.
This workshop provides a forum to discuss current practice as well as near future research needs in the long-term trend of variability/reliability and their impact on design performance and cost, as well as detailed technical aspects of variability/reliability characterization, compact modeling, statistical simulation, test structure design, CAD, as well as resilient design. The workshop also provides an opportunity to discuss emerging modeling and characterization needs in emerging devices. The following are the key areas that will be covered. Compared to other workshops, we strive to establish the links among technology, device physics, device modeling, EDA tools, and related circuit design issues. • Fundamental device physics and device engineering • CAD tools: modeling, simulation, and tool integration • Design interface: design impact and characterization techniques We pick three focus topics each year on joint technology-design efforts. The rest of the workshop will be formatted as open call-for-poster format. Short oral presentations will be given by all the poster presenters in advance of the poster session. This year, we plan to focus on the following topics: - Ising Computing - In-Memory Computing - MEMS