2017 International Conference On Computer Aided Design

The Premier Conference Devoted to Technical Innovations in Electronic Design Automation

November 13-16, 2017Irvine Marriott Irvine, CA

MP Associates, Inc.
MONDAY November 13, 2:00pm - 4:00pm | Salon E
Modern Techniques for Challenging Verification Problems
Ian Harris - Univ. of California, Irvine
This session presents a range of SAT-based techniques to conquer major challenges in pre-silicon, post-silicon, repair and functional timing. The first paper proposes a novel approach for SAT-based model checking using approximations. The second paper introduces an approach for improving the coverage of electrical bugs in post silicon validation. The third paper formulates the problem of patching sequential circuits in the presence of retiming and resynthesis. The final paper in the session accelerates functional timing analysis by removing redundancies from the CNF formula that describes the functional and timing constraints on a path.

2A.1*Safety Model Checking With Complimentary Approximations
 Speaker: Jianwen Li - Rice Univ. & East China Normal Univ.
 Authors: Jianwen Li - Rice Univ. & East China Normal Univ.
Shufang Zhu - East China Normal Univ.
Yueling Zhang - East China Normal Univ.
Geguang Pu - East China Normal Univ.
Moshe Vardi - Rice Univ.
2A.2An Automated SAT-based Method for the Design of On-Chip Bit-flip Detectors
 Speaker: Nicola Nicolici - McMaster Univ.
 Authors: Pouya Taatizadeh - McMaster Univ.
Nicola Nicolici - McMaster Univ.
2A.3Sequential Engineering Change Order Under Retiming and Resynthesis
 Speaker: Nian-Ze Lee - National Taiwan Univ.
 Authors: Nian-Ze Lee - National Taiwan Univ.
Victor Kravets - IBM Corp.
Jie-Hong Roland Jiang - National Taiwan Univ.
2A.4Accelerating Functional Timing Analysis with Encoding Duplication Removal and Redundant State Propagation
 Speaker: Denny C.-Y. Wu - National Chiao Tung Univ.
 Authors: Denny C.-Y. Wu - National Chiao Tung Univ.
Pin-Ru Jhao - National Chiao Tung Univ.
Charles H.-P. Wen - National Chiao Tung Univ.

* Indicates Best Paper Candidate