2017 International Conference On Computer Aided Design

The Premier Conference Devoted to Technical Innovations in Electronic Design Automation

November 13-16, 2017Irvine Marriott Irvine, CA

Paper 1B.1 - Joint Design-Time and Post-Silicon Minimization of Parametric Yield Loss using Adjustable Robust Optimization
Murai Mani, Ashish K. Singh, Michael Orshansky - 
Univ. of Texas, Austin, TX