2019 International Conference On Computer Aided Design

The Premier Conference Devoted to Technical Innovations in Electronic Design Automation

November 4-7, 2019The Westin Westminster Westminster, CO

Paper 1B.1 - Joint Design-Time and Post-Silicon Minimization of Parametric Yield Loss using Adjustable Robust Optimization
Murai Mani, Ashish K. Singh, Michael Orshansky - 
Univ. of Texas, Austin, TX