2020 International Conference On Computer Aided Design

The Premier Conference Devoted to Technical Innovations in Electronic Design Automation

November 2-5, 2020VIRTUAL CONFERENCE

Paper 1B.1 - Joint Design-Time and Post-Silicon Minimization of Parametric Yield Loss using Adjustable Robust Optimization
Murai Mani, Ashish K. Singh, Michael Orshansky - 
Univ. of Texas, Austin, TX